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<article xsi:noNamespaceSchemaLocation="http://jats.nlm.nih.gov/publishing/1.1/xsd/JATS-journalpublishing1-mathml3.xsd" dtd-version="1.1" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"><front><journal-meta><journal-id journal-id-type="publisher-id">JERA</journal-id><journal-title-group><journal-title>Journal of Electronic Research and Application</journal-title></journal-title-group><issn>2208-3502</issn><eissn>2208-3510</eissn><publisher><publisher-name>Bio-Byword Scientific Publishing Pty. Ltd.</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.26689/jera.v10i2.13678</article-id><article-categories><subj-group subj-group-type="heading"><subject>Article</subject></subj-group></article-categories><title>Near-Room-Temperature Performance Characterization of InAsSb XBn Devices</title><url>https://artdesignp.com/journal/JERA/10/2/10.26689/jera.v10i2.13678</url><author>ChenDongqiong,WangHairong,LiRujie,DengGongrong</author><pub-date pub-type="publication-year"><year>2026</year></pub-date><volume>10</volume><issue>2</issue><history><date date-type="pub"><published-time>2026-03-04</published-time></date></history><abstract>This research aims to enhance the operating temperature of mid-infrared InAsSb XBn detectors (~4.5 μm cutoff) through specific device architecture. Measurements performed under front-side illumination without an antireflection coating showed that at 290 K, the quantum efficiency was 34% for nBn devices compared to 45% for pBn devices. The nBn and pBn devices displayed distinct performance metrics at 290 K under a 500-mV reverse bias. The nBn devices recorded a dark current density of 0.348 A/cm2 and a peak specific detectivity of 8.24×108 cm‧Hz1/2/W, whereas the pBn devices demonstrated improved characteristics with values of 0.536 A/cm2 and 5.92×109 cm‧Hz1/2/W, respectively. 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