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<article xsi:noNamespaceSchemaLocation="http://jats.nlm.nih.gov/publishing/1.1/xsd/JATS-journalpublishing1-mathml3.xsd" dtd-version="1.1" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"><front><journal-meta><journal-id journal-id-type="publisher-id">JERA</journal-id><journal-title-group><journal-title>Journal of Electronic Research and Application</journal-title></journal-title-group><issn>2208-3502</issn><eissn>2208-3510</eissn><publisher><publisher-name>Bio-Byword Scientific Publishing Pty. Ltd.</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.26689/jera.v10i2.14386</article-id><article-categories><subj-group subj-group-type="heading"><subject>Article</subject></subj-group></article-categories><title>GRIN Lens End Face Classification Detection Based on Deep Learning</title><url>https://artdesignp.com/journal/JERA/10/2/10.26689/jera.v10i2.14386</url><author>ZhangJianqiang,FuYong'an,ZhangFoxiang</author><pub-date pub-type="publication-year"><year>2026</year></pub-date><volume>10</volume><issue>2</issue><history><date date-type="pub"><published-time>2026-04-03</published-time></date></history><abstract>With the rapid development of optical communication technology, the demand for gradient-index (GRIN) lenses has increased significantly, making quality inspection of lens end faces an increasingly critical issue. In particular, accurate detection of defects on both ends of GRIN lenses remains a challenging task. To address this problem, this study employs a transfer learning-based parameter fine-tuning approach to evaluate the classification performance of four deep learning models on a defect dataset. Among the evaluated models, ResNet50 and DenseNet-169 demonstrated superior performance and were selected for further optimization. Attention mechanisms, including squeeze-and-excitation (SE) and convolutional block attention module (CBAM), were incorporated into these models to enhance feature representation. Experimental results show that, after integrating the SE module, the classification accuracy of ResNet50 and DenseNet-169 increased by 0.0243 and 0.0272, respectively. With the addition of the CBAM module, the accuracy improvements reached 0.0437 for ResNet50 and 0.0506 for DenseNet-169. These results indicate that the proposed improvements significantly enhance the defect detection capability of the models. All evaluation metrics show consistent improvement over the baseline models, demonstrating that the integration of attention mechanisms effectively increases the classification accuracy and overall performance of the original network architectures.</abstract><keywords/></article-meta></front><body/><back><ref-list><ref id="B1" content-type="article"><label>1</label><element-citation publication-type="journal"><p>Xing J, Jiao M, Liu Y, 2015, Application of Self Focusing Lens in all Solid-State Lasers. Journal of Xi’an University of Technology, 31(2): 127–131+124.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B2" content-type="article"><label>2</label><element-citation publication-type="journal"><p>Wu S, Zhang M, Zhang B, 2016, Hierarchical Structure Information and Its Expression for Image Features Extraction and Processing of GRIN Lens End, Science And Engineering Research Center, Proceedings of 2016 International Conference on Electrical Engineering and Automation (ICEEA 2016), 643–646.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B3" content-type="article"><label>3</label><element-citation publication-type="journal"><p>Wu S, Zhang B, Zhang M, 2017, An Improved Median Filtering Method and its Applications in Features Extraction of GRIN Lens EndImage”.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B4" content-type="article"><label>4</label><element-citation publication-type="journal"><p>Chu H, 2011, Research on Surface Defect Detection Technology of Optical Components in High Power Laser Devices Based on Machine Vision, thesis, Chongqing University.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B5" content-type="article"><label>5</label><element-citation publication-type="journal"><p>Sowers I, 1999, Optical Cleanliness Specifications and Cleanliness Verification, Proceedings of the 44th Annual Meeting of the International Symposium on Optical Science, Engineering, and Instrumentation, 525–530.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B6" content-type="article"><label>6</label><element-citation publication-type="journal"><p>Shi W, 2000, Research on High-Precision Cleanliness Detection Methods, thesis, Sichuan University, 9–15.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B7" content-type="article"><label>7</label><element-citation publication-type="journal"><p>Liu G, Wang J, Ning R, et al., 2021, Self Focusing Lens End Face Image Processing and Defect Feature Extraction. Electronic Production, 2021(5): 74–76.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B8" content-type="article"><label>8</label><element-citation publication-type="journal"><p>Wu J, 2020, Research and Implementation of Fine-Grained Emotion Classification Method Based on Attention Mechanism, thesis, Heilongjiang University.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B9" content-type="article"><label>9</label><element-citation publication-type="journal"><p>Bas A, Huber P, Smith W, et al., 2017, 3D Morphable Models as Spatial Transformer Networks, 2017 IEEE International Conference on Computer Vision Workshop (ICCVW), 895–903.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B10" content-type="article"><label>10</label><element-citation publication-type="journal"><p>Woo S, Park J, Lee J, et al., 2018, Cbam: Convolutional Block Attention Module. 2018 European Conference on Computer Vision (ECCV), 3–19.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B11" content-type="article"><label>11</label><element-citation publication-type="journal"><p>Jie H, Li S, Samuel A, et al., 2020, Squeeze-and-Excitation Networks. IEEE Transactions on Pattern Analysis and Machine Intelligence, 42(8): 2011–2023.</p><pub-id pub-id-type="doi"/></element-citation></ref><ref id="B12" content-type="article"><label>12</label><element-citation publication-type="journal"><p>Woo S, Park J, Lee J, et al., 2018, CBAM: Convolutional Block Attention Module, The European Conference on Computer Vision, 3–19.</p><pub-id pub-id-type="doi"/></element-citation></ref></ref-list></back></article>
