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<article xsi:noNamespaceSchemaLocation="http://jats.nlm.nih.gov/publishing/1.1/xsd/JATS-journalpublishing1-mathml3.xsd" dtd-version="1.1" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance"><front><journal-meta><journal-id journal-id-type="publisher-id">JERA</journal-id><journal-title-group><journal-title>Journal of Electronic Research and Application</journal-title></journal-title-group><issn>2208-3502</issn><eissn>2208-3510</eissn><publisher><publisher-name>Bio-Byword Scientific Publishing Pty. Ltd.</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.26689/jera.v9i4.11450</article-id><article-categories><subj-group subj-group-type="heading"><subject>Article</subject></subj-group></article-categories><title>Study on EMC and OTA Anechoic Chamber Compatibility</title><url>https://artdesignp.com/journal/JERA/9/4/10.26689/jera.v9i4.11450</url><author>ZhouYinfeng,ChenMing,TianYu,ZhouXun,ShenPei</author><pub-date pub-type="publication-year"><year>2025</year></pub-date><volume>9</volume><issue>4</issue><history><date date-type="pub"><published-time>2025-08-08</published-time></date></history><abstract>EMC anechoic chamber is used for radiation emission and radiation immunity test, and the wireless performance of products needs to be tested in OTA anechoic chamber. With more and more electronic and electrical equipment with wireless communication function, the rapid construction of a compatible OTA test system in the existing EMC anechoic chamber can save the cost and space of enterprises and third-party laboratories that already have EMC anechoic chamber. In this paper, the OTA test system is built in the existing EMC anechoic room, the ripple calibration test is carried out according to the OTA standard, the TRP and TIS tests are carried out on two test samples with different wireless communication standards, and the test samples are taken to the OTA anechoic room for a comparison test. The comparison between the ripple calibration data and the OTA test data showed that the EMC anechoic chamber could perform OTA test without affecting the original test ability. The data results provide a basis for the implementation of EMC anechoic chamber compatibility upgrade OTA test, and provide reference for further optimization of the compatible test system, reduction of test differences, and the design of anechoic chamber integrating two test functions.</abstract><keywords/></article-meta></front><body/><back><ref-list><ref id="B1" content-type="article"><label>1</label><element-citation publication-type="journal"><p>Takahashi, Masanori, Suzuki, et al., 2006, High Speed System for Measuring Electromagnetic Field Distribution (Electromagnetic Compatibility (EMC)). 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